Roy Koret

Title: Roy Koret: Innovator in Optical Metrology

Introduction

Roy Koret is a distinguished inventor based in Raanana, Israel. He has made significant contributions to the field of optical metrology, particularly in the analysis of patterned structures. With a total of 2 patents to his name, Koret's work has advanced the understanding and application of optical measurement techniques.

Latest Patents

Koret's latest patents focus on methods and systems for optical metrology in patterned structures. The first patent describes a technique for determining parameters of a patterned structure located on top of an underneath layered structure. This method utilizes input data, including first measured data PMD, which is a function of spectral intensity and phase. The second patent presents a data analysis method for determining parameters of a patterned structure, emphasizing the relationship between theoretical and modeled optical responses.

Career Highlights

Roy Koret is currently employed at Nova Measuring Instruments Ltd., where he continues to innovate in the field of optical metrology. His work has been instrumental in developing advanced measurement systems that enhance the accuracy and efficiency of optical analysis.

Collaborations

Koret has collaborated with notable colleagues, including Boris Levant and Yanir Hainick. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Roy Koret's contributions to optical metrology exemplify the impact of innovative thinking in technology. His patents and career achievements reflect a commitment to advancing measurement techniques in patterned structures.