Company Filing History:
Years Active: 2006-2009
Title: Innovations by Roman Milter in Integrated Circuit Testing
Introduction
Roman Milter is a prominent inventor based in San Francisco, CA, known for his significant contributions to the field of integrated circuit testing. With a total of four patents to his name, Milter has developed innovative solutions that enhance the performance and reliability of electronic components.
Latest Patents
Milter's latest patents focus on systems for testing and packaging integrated circuits. One of his notable inventions involves several embodiments of stress metal springs, which typically comprise a plurality of stress metal layers established on a substrate. These layers are controllably patterned and partially released from the substrate, creating an effective rotation angle that defines a looped spring structure. The formed springs provide high pitch compliant electrical contacts for various interconnection systems, including chip scale semiconductor packages, high-density interposer connectors, and probe contactors. Additionally, he has disclosed several embodiments of massively parallel interface integrated circuit test assemblies, which utilize stress metal spring contacts to establish connections between separated integrated circuits on a compliant wafer carrier.
Career Highlights
Throughout his career, Roman Milter has made significant strides in the field of electronics and integrated circuit technology. His work has not only advanced the understanding of stress metal springs but has also paved the way for more efficient testing methods in the semiconductor industry. Milter's innovative designs have been instrumental in improving the performance of electronic devices.
Collaborations
Milter has