Company Filing History:
Years Active: 2017-2021
Title: Rohit Bothra: Innovator in Charged Particle Microscopy
Introduction
Rohit Bothra is a notable inventor based in Milpitas, CA (US). He has made significant contributions to the field of charged particle microscopy, holding a total of 3 patents. His work focuses on improving image beam stabilization and interrogation techniques in scanning electron microscopy systems.
Latest Patents
One of Rohit Bothra's latest patents is a method and system for charged particle microscopy with improved image beam stabilization and interrogation. This innovative scanning electron microscopy system features an electron beam source designed to generate an electron beam. It also includes a set of electron-optical elements that direct a portion of the electron beam onto a sample. The system is equipped with an emittance analyzer assembly and a splitter element that directs secondary electrons and/or backscattered electrons emitted from the sample's surface to the emittance analyzer assembly. This assembly is configured to image the secondary electrons and/or backscattered electrons, enhancing the overall imaging capabilities of the system.
Career Highlights
Rohit Bothra has worked with prominent companies in the industry, including KLA-Tencor Corporation and KLA Corporation. His experience in these organizations has contributed to his expertise in the field of microscopy and imaging technologies.
Collaborations
Rohit has collaborated with several professionals in his field, including Doug Keith Masnaghetti and Gabor D Toth. These collaborations have likely enriched his work and contributed to his innovative approaches in microscopy.
Conclusion
Rohit Bothra is a distinguished inventor whose work in charged particle microscopy has led to advancements in imaging technology. His patents and career achievements reflect his commitment to innovation in this specialized field.