Company Filing History:
Years Active: 1994-2015
Title: The Innovations of Roger J Yerdon
Introduction
Roger J Yerdon is a notable inventor based in Pleasant Valley, NY (US). He has made significant contributions to the field of semiconductor manufacturing, holding a total of 6 patents. His work focuses on improving the precision and efficiency of lithographic processes.
Latest Patents
One of Yerdon's latest patents is titled "Target and method for mask-to-wafer CD, pattern placement and overlay measurement and control." This innovative method enhances mask-to-wafer correlation among multiple masking levels in semiconductor manufacturing. It involves creating compact targets for measuring critical dimensions and overlay variations, thereby improving the accuracy of the lithographic process. Another significant patent is "Fabrication of lithographic image fields using a proximity stitch metrology." This method addresses stitching errors in multiple lithographically exposed fields, allowing for precise calculations of petal position errors, which are crucial for maintaining the integrity of semiconductor layers.
Career Highlights
Roger J Yerdon is currently employed at International Business Machines Corporation (IBM), where he continues to develop cutting-edge technologies in semiconductor manufacturing. His expertise in lithography and metrology has positioned him as a key player in the industry.
Collaborations
Yerdon has collaborated with notable coworkers such as Donald J Samuels and Christopher P Ausschnitt, contributing to various projects that enhance semiconductor manufacturing processes.
Conclusion
Roger J Yerdon's innovative work and patents have significantly advanced the field of semiconductor manufacturing. His contributions continue to influence the industry, showcasing the importance of precision in technological advancements.