Robert J Halford

Title: Innovations by Robert J Halford

Introduction

Robert J Halford is an accomplished inventor based in Chippewa Falls, WI (US). He holds a total of 7 patents that showcase his expertise in critical systems and data management. His innovative approaches have significantly contributed to the fields of technology and data integrity.

Latest Patents

One of Halford's latest patents is titled "Method and architecture for critical systems utilizing multi-centric orthogonal topology and pervasive rules-driven data and control encoding." This invention focuses on novel systems and methods for processing and managing data in critical or large-scale systems, such as airliners, automobiles, space stations, power plants, and healthcare systems. The method emphasizes a rules-driven data and control approach that enhances the reliability of operational systems. By maintaining an algebraic encoding of control and application data, Halford's invention can detect, isolate, and correct errors that might otherwise go unnoticed.

Another significant patent is the "Multi-dimensional data protection and mirroring method for micro level data." This invention introduces a data validation, mirroring, and error/erasure correction method for the protection of one and two-dimensional data at the micro level. The method utilizes unique error correction codes (ECC) to enable error detection and correction, outperforming conventional mirroring techniques. This innovation is particularly beneficial for applications requiring critical data integrity, providing end-to-end protection and validation.

Career Highlights

Throughout his career, Robert J Halford has worked with notable companies, including Cray Research, Inc. His experience in these organizations has allowed him to develop and refine his innovative ideas, contributing to advancements in technology and data management.

Collaborations

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Conclusion

Robert J Halford's contributions to the field of technology through his patents demonstrate his commitment to innovation and excellence. His work continues to influence critical systems and data management practices, ensuring reliability and integrity in various applications.