The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 1994

Filed:

Mar. 18, 1993
Applicant:
Inventor:

Robert J Halford, Chippewa Falls, WI (US);

Assignee:

Cray Research Systems, Inc., Minneapolis, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M / ;
U.S. Cl.
CPC ...
371 404 ; 371 401 ; 360 39 ;
Abstract

The present invention discloses an error recovery method for parallel architecture data storage devices. The present invention provides means for simultaneously arranging data on a plurality of recording surfaces so that intermittent and/or solid failures do not prevent access to the data stored thereon. A first error correcting code comprising a parity bit is generated for each dataword. The dataword and the parity bit are stored simultaneously and bit-wise to a plurality of recording surfaces. A second error correcting code is generated for a plurality of bits transmitted to a specific recording surface. The second error correcting code is written onto the same recording surface as the bits from which it was generated. The second error correcting code is used to detect and correct intermittent errors in the data read from a particular recording surface. The first error correcting code is used to correct data read from a particular surface when the second error correcting code indicates that a solid failure has occurred, which the second error correcting code cannot correct. The result is a data storage device combining large capacity and fast transfer rates with improved fault tolerance.


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