Eindhoven, Netherlands

Robert Imlau

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Fei Comapny. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Robert Imlau. Retrieved from https://idiyas.com/inventor/robert-imlau

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: The Innovations of Robert Imlau

Introduction

Robert Imlau is a notable inventor based in Eindhoven, Netherlands. He has made significant contributions to the field of microscopy, particularly through his innovative patent. His work focuses on enhancing imaging techniques, which are crucial for various scientific applications.

Latest Patents

Robert Imlau holds a patent for a "Discriminative imaging technique in scanning transmission charged particle microscopy." This method involves imaging a specimen in a Scanning Transmission Charged Particle Microscope, comprising several advanced steps that improve the quality and accuracy of the imaging process. He has 1 patent to his name, showcasing his expertise in this specialized area.

Career Highlights

Imlau is currently employed at FEI Company, where he continues to develop and refine imaging technologies. His role at the company allows him to collaborate with other experts in the field and contribute to groundbreaking advancements in microscopy.

Collaborations

Throughout his career, Robert has worked alongside talented individuals such as Eric Gerardus Bosch and Ivan Lazic. These collaborations have fostered an environment of innovation and have led to significant advancements in their respective fields.

Conclusion

Robert Imlau's contributions to the field of microscopy through his innovative patent and collaborative efforts highlight his importance as an inventor. His work continues to influence the scientific community and improve imaging techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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