Tucson, AZ, United States of America

Robert E Parks

USPTO Granted Patents = 10 

Average Co-Inventor Count = 2.3

ph-index = 7

Forward Citations = 157(Granted Patents)


Location History:

  • Lilburn, GA (US) (1991)
  • Asheboro, NC (US) (2001)
  • Tucson, AZ (US) (1996 - 2015)

Company Filing History:


Years Active: 1991-2015

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10 patents (USPTO):Explore Patents

Title: Innovations of Robert E Parks

Introduction

Robert E Parks is a notable inventor based in Tucson, AZ, with a remarkable portfolio of 10 patents. His work primarily focuses on advanced metrology systems and optical technologies, contributing significantly to the field of precision measurement.

Latest Patents

One of his latest patents is a "System and method for non-contact metrology of surfaces." This innovative system utilizes a display programmed with multiple targets that shine on a specular surface. The reflected targets are detected by an imaging device, allowing for the characterization of reflective surfaces. The system can identify deviations in surface characteristics by analyzing the expected versus actual locations of the reflected targets. Another significant patent is the "Point source module and methods of aligning and using the same." This invention includes a compact and robust device for measuring or locating optical or mechanical datum of parts during manufacturing or assembly. It features a Shack cube with a beam splitter and a point source of optical radiation, enhancing the precision of measurements.

Career Highlights

Throughout his career, Robert E Parks has worked with various organizations, including the Government of the United States of America, as represented by the Secretary of Commerce. His contributions have been instrumental in advancing metrology and optical technologies.

Collaborations

Robert has collaborated with notable individuals such as William P Kuhn and Christopher James Evans, further enriching his innovative endeavors.

Conclusion

Robert E Parks stands out as a significant figure in the field of invention, with his patents reflecting a deep understanding of metrology and optical systems. His work continues to influence advancements in precision measurement technologies.

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