Rigalantu Ji

Title: Rigalantu Ji: Innovator in Grating Measuring Devices

Introduction

Rigalantu Ji is a notable inventor based in Changchun, China. He has made significant contributions to the field of optical measurement technology, holding 2 patents that showcase his innovative approach to grating measuring devices.

Latest Patents

Rigalantu Ji's latest patents include the "Heterodyne Two-Dimensional Grating Measuring Device and Measuring Method Thereof." This invention features a light source that generates two beams of linearly polarized light with overlapping characteristics, polarization orthogonality, and a fixed frequency difference. The reading head receives these beams, which then interact with a moving two-dimensional measuring grating to produce ±1-order diffracted lights. These lights are processed to achieve precise displacement measurements.

Another significant patent is the "Heterodyne One-Dimensional Grating Measuring Device and Measuring Method Thereof." This device also utilizes a light source to create two linearly polarized lights. The reading head captures these lights as they interact with a measuring grating, generating +1-order and −1-order diffracted lights. The resulting beat frequency signals are processed to measure displacement accurately.

Career Highlights

Rigalantu Ji has worked at prestigious institutions, including the Changchun Institute of Optics, Fine Mechanics and Physics, and the Chinese Academy of Sciences. His work at these organizations has allowed him to develop and refine his innovative measuring devices.

Collaborations

Rigalantu Ji has collaborated with notable colleagues, including Zhaowu Liu and Hongzhu Yu. Their combined expertise has contributed to advancements in optical measurement technologies.

Conclusion

Rigalantu Ji's contributions to the field of optical measurement through his innovative patents and collaborations highlight his role as a significant inventor. His work continues to influence advancements in measurement technology.