The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2024
Filed:
Mar. 31, 2022
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, CN;
Wenhao Li, Changchun, CN;
Zhaowu Liu, Changchun, CN;
Wei Wang, Changchun, CN;
Hongzhu Yu, Changchun, CN;
Rigalantu Ji, Changchun, CN;
Xuefeng Yao, Changchun, CN;
Abstract
A heterodyne one-dimensional grating measuring device and measuring method thereof, including a light source, a reading head, a photoelectric receiving module, and a signal processing system. The light source is configured to generate two linearly polarized lights having characteristics of overlapping, polarization orthogonal, and fixed frequency difference. The reading head is configured to receive two beams of polarized lights and be respectively incident on a surface of a moving measuring grating to generate a +1-order diffracted light and a −1-order diffracted light. The photoelectric receiving module is configured to receive the +1-order diffracted light and the −1-order diffracted light to form two paths of beat frequency signals. The signal processing system is configured to perform differential calculation on the two paths of the beat frequency signals to realize a displacement measurement of single diffraction of the measuring grating for four-fold optical subdivision.