Company Filing History:
Years Active: 1999-2006
Title: Richard J Schmidley: Innovator in Multi-Dimensional Metrology
Introduction
Richard J Schmidley is a notable inventor based in San Jose, California. He has made significant contributions to the field of metrology and inspection technologies. With a total of four patents to his name, Schmidley has developed innovative systems and methods that enhance the accuracy and efficiency of dimensional assessments.
Latest Patents
Schmidley's latest patents include "Systems and methods for multi-dimensional metrology and/or inspection of a specimen." This patent describes a method that involves scanning a specimen with partial oblique illumination to create an image of its structure. The method integrates the intensity of the image to determine the height of the structure, which may be proportional or inversely proportional to the height. Additionally, it includes scanning the specimen with bright field illumination to form a bright field image, allowing for the detection of defects and the determination of lateral dimensions.
Another significant patent is "Systems and methods for multi-dimensional inspection and/or metrology of a specimen." This invention features a system that scans the specimen with light at multiple focal planes simultaneously. It includes a collection system with multiple collectors that gather light from these focal planes. A processor assesses the relative intensity of the collected light to determine the dimensions of features on the specimen.
Career Highlights
Throughout his career, Richard J Schmidley has worked with prominent companies in the technology sector. He has been associated with Kla-Tencor Technologies Corporation and Clear Logic, Inc. His work in these organizations has contributed to advancements in metrology and inspection technologies.
Collaborations
Schmidley has collaborated with notable professionals in his field, including Tim S Wihl and Stephen Hiebert. These collaborations have likely fostered innovation and the exchange of ideas, further enhancing the impact of his work.
Conclusion
Richard J Schmidley is a distinguished inventor whose work in multi-dimensional metrology has paved the way for advancements in inspection technologies. His patents reflect a commitment to innovation and precision in the field.