Rich Ackerman

Title: Rich Ackerman: Innovator in Semiconductor Testing Technologies

Introduction

Rich Ackerman is a notable inventor based in Wilsonville, OR (US). He has made significant contributions to the field of semiconductor device testing, holding a total of 4 patents. His work focuses on enhancing the efficiency and accuracy of testing procedures in the semiconductor industry.

Latest Patents

Ackerman's latest patents include innovative technologies such as "Field triage of EOS failures in semiconductor devices" and "Scan chain fault diagnosis." The first patent describes automated test procedures that utilize software control to test devices, allowing for the detection and diagnosis of various types of failures. This system enables frontline testing of devices in the field, providing nearly immediate responses to customers and reducing 'false returns' by differentiating between usage issues and genuine quality problems. The second patent focuses on identifying a reference scan cell related to fault conditions in a scan chain, employing a method that outputs combinational logic values to scan cells, thereby enhancing fault diagnosis capabilities.

Career Highlights

Rich Ackerman is currently employed at Teseda Corporation, where he continues to develop and refine testing technologies for semiconductor devices. His expertise in this area has positioned him as a key figure in advancing the industry's testing methodologies.

Collaborations

Ackerman collaborates with talented individuals such as John Raykowski and Joseph M Salazar, contributing to a dynamic team focused on innovation in semiconductor testing.

Conclusion

Rich Ackerman's contributions to semiconductor testing technologies demonstrate his commitment to innovation and excellence in the field. His patents reflect a deep understanding of the challenges faced in the industry and provide solutions that enhance testing efficiency and accuracy.