The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2018
Filed:
Dec. 08, 2014
Teseda Corporation, Portland, OR (US);
Joseph M. Salazar, Portland, OR (US);
Rich Ackerman, Willsonville, OR (US);
John Raykowski, Beaverton, OR (US);
Armagan Akar, Portland, OR (US);
Ralph Sanchez, Amity, OR (US);
TESEDA CORPORATION, Portland, OR (US);
Abstract
Automated test procedures, carried out under software control, can be employed to test a device, testing individual pins, and/or groups of pins, to detect and diagnose or characterize various types of failures. A distributed FA system includes a shared database for device definitions, test setups, and test results. Test platforms provide I/O curve tracing which can provide both a qualitative visual representation and a quantitative measured performance. The disclosed system enables and exploits front line testing of devices in the field. Response to the customer can be nearly immediate. Eliminate 'false returns' by differentiation of use versus a real quality issue.