Austin, TX, United States of America

Reuben Quintanilla


Average Co-Inventor Count = 2.0

ph-index = 4

Forward Citations = 198(Granted Patents)


Company Filing History:


Years Active: 1996-1998

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4 patents (USPTO):Explore Patents

Title: Reuben Quintanilla: Innovator in Semiconductor Technology

Introduction

Reuben Quintanilla is a notable inventor based in Austin, TX, who has made significant contributions to the field of semiconductor technology. With a total of 4 patents to his name, Quintanilla has developed innovative methods that enhance the efficiency and accuracy of semiconductor defect analysis.

Latest Patents

Quintanilla's latest patents include a "Method and system for declustering semiconductor defect data" and a "Method and system for automated die yield prediction in semiconductor." The first patent focuses on improving the classification of defect data by determining local and average defect densities on a wafer substrate. This method allows for more accurate noise removal in defect data, which is crucial for maintaining the integrity of semiconductor manufacturing. The second patent involves a program that analyzes defect data across multiple layers of a wafer substrate to predict die yield. By assigning kill factors to defects based on specific parameters, this system calculates failure probabilities and estimates die loss, thereby optimizing production processes.

Career Highlights

Quintanilla is currently employed at Advanced Micro Devices Corporation, a leading company in the semiconductor industry. His work at AMD has allowed him to apply his innovative ideas in a practical setting, contributing to advancements in semiconductor technology.

Collaborations

Quintanilla has collaborated with fellow inventor Alan Bruce Berezin, working together to push the boundaries of semiconductor research and development.

Conclusion

Reuben Quintanilla's contributions to semiconductor technology through his patents and work at Advanced Micro Devices Corporation highlight his role as an influential inventor in the industry. His innovative methods for defect analysis and yield prediction are paving the way for more efficient semiconductor manufacturing processes.

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