Ralph Juettner

Title: Ralph Juettner: Innovator in Wafer Probe Technology

Introduction

Ralph Juettner is a notable inventor based in Dresden, Germany. He has made significant contributions to the field of wafer probe technology, particularly through his innovative patent that enhances the calibration processes in probe stations.

Latest Patents

Ralph Juettner holds a patent for a "Procedure for reproduction of a calibration position of an aligned and afterwards displaced calibration substrate in a probe station." This invention involves a wafer probe station equipped with a wafer chuck and a probe needle arrangement. The technology allows for high-frequency testing of wafers by contacting selected pads on the wafer and calibration substrate. The procedure utilizes first and second measurement systems to calculate a new offset position of the calibration substrate after loading a second wafer, ensuring precise calibration.

Career Highlights

Ralph Juettner is associated with Suss Microtec Test Systems GmbH, a company known for its advanced testing solutions in the semiconductor industry. His work has contributed to improving the efficiency and accuracy of wafer testing processes.

Collaborations

Ralph has collaborated with notable colleagues, including Joerg Kiesewetter and Axel Schmidt, who share his commitment to innovation in the field of semiconductor testing.

Conclusion

Ralph Juettner's contributions to wafer probe technology through his patent and work at Suss Microtec Test Systems GmbH highlight his role as an influential inventor in the industry. His innovations continue to impact the efficiency of semiconductor testing processes.