Rakesh Poddar

Title: **Rakesh Poddar: Innovator in Metrology Instrumentation**

Introduction

Rakesh Poddar is a notable inventor based in Camarillo, California. With a focus on advancements in surface analysis instrumentation, he has made significant contributions to the field through his innovative patent.

Latest Patents

Rakesh holds a patent for a "Metrology probe with built-in angle and method of fabrication thereof." This patent describes a method for batch-fabricating an array of probe devices designed for use in surface analysis instruments, like atomic force microscopes (AFM). It emphasizes the process of providing a wafer and photolithographically forming a base and cantilever for each probe. Notably, the cantilever is designed to include a built-in angle relative to the base, ensuring that the base remains substantially parallel to the sample holder when mounted in the probe holder of the surface analysis instrument.

Career Highlights

Rakesh Poddar works at Bruker Nano GmbH, where he continues to push the boundaries of metrology technology. His focus on practical and innovative solutions has garnered attention within the industry.

Collaborations

Throughout his career, Rakesh has collaborated with talented professionals, including coworkers Jeffrey Wong and Joseph S Fragala. Their collective expertise has contributed to the advancement of metrology instrumentation at their organization.

Conclusion

Rakesh Poddar's contributions to the field of surface analysis and metrology highlight his commitment to innovation and technological advancement. His work not only demonstrates his capabilities as an inventor but also enriches the resources available to researchers and professionals in the industry.