This inventor holds 3 USPTO granted patents. Top assignee: Intel Corporation. Active years: 2003-2010.
Location History:
- Sunnyvale, CA (US) (2003 - 2006)
- Saratoga, CA (US) (2010)
Company Filing History:
Years Active: 2003-2010
Title: Rajesh Galivanche: Innovator in Circuit Error Detection
Introduction
Rajesh Galivanche is a notable inventor based in Sunnyvale, CA. He has made significant contributions to the field of circuit design and error detection. With a total of 3 patents to his name, Galivanche has demonstrated his expertise and innovative thinking in technology.
Latest Patents
One of his latest patents is titled "Device, system, and method for optimized concurrent error detection." This invention involves a method, apparatus, and system for accepting a plurality of user-selected properties pre-designated for detecting errors in portions of a circuit. It also includes accepting a plurality of user-selected erroneous outputs, executing a simulation of the circuit for each property, and performing error correction based on the detected outputs. Another significant patent is the "Dft technique for avoiding contention/conflict in logic built-in self-test." This invention features a packaged component that includes a pattern generator for generating random data patterns and a programmable constraint correction module to replace undesirable patterns with desirable sequences, thus overcoming bus contention problems.
Career Highlights
Rajesh Galivanche is currently employed at Intel Corporation, where he continues to innovate and contribute to advancements in circuit technology. His work focuses on enhancing the reliability and efficiency of circuit designs through effective error detection methods.
Collaborations
Throughout his career, Galivanche has collaborated with talented individuals such as Sandip Kundu and Sanjay Sengupta. These collaborations have further enriched his work and contributed to the development of innovative solutions in the field.
Conclusion
Rajesh Galivanche is a distinguished inventor whose work in circuit error detection has made a significant impact on technology. His patents reflect his commitment to innovation and excellence in the field.