Company Filing History:
Years Active: 2005-2010
Title: Radel Ben-Av: Innovator in Charged Particle Beam Technology
Introduction
Radel Ben-Av is a notable inventor based in Rehovot, Israel. He has made significant contributions to the field of charged particle beam technology, holding 2 patents that enhance the examination of specimens.
Latest Patents
His latest patents include a method and system for the examination of specimens using a beam of charged particles. This invention allows for the generation of multiple images of a specimen from different viewing angles, providing a wealth of additional information compared to a single image. The method involves tilting the beam and repositioning the specimen to ensure that the same area is scanned while capturing the second image. Another patent focuses on a method for scanning a specimen with beams of charged particles from multiple sources. This innovation enables the scanning of target points with charged particle beams emitted at different times, enhancing the efficiency and accuracy of the examination process.
Career Highlights
Radel Ben-Av is currently employed at Applied Materials, Inc., where he continues to develop and refine technologies related to charged particle beams. His work has positioned him as a key figure in advancing the capabilities of specimen examination.
Collaborations
He collaborates with talented colleagues, including Alex Goldenshtein and Asher Pearl, contributing to a dynamic and innovative work environment.
Conclusion
Radel Ben-Av's contributions to charged particle beam technology through his patents and work at Applied Materials, Inc. highlight his role as a significant innovator in the field. His inventions are paving the way for more advanced methods of specimen examination.