Yongin-si, South Korea

Pyung-moon Zhang

USPTO Granted Patents = 5 

Average Co-Inventor Count = 2.1

ph-index = 2

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2008-2020

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5 patents (USPTO):Explore Patents

Title: Pyung-moon Zhang: Innovator in Built-in Self-Test Circuits

Introduction

Pyung-moon Zhang is a notable inventor based in Yongin-si, South Korea. He has made significant contributions to the field of memory devices and testing circuits. With a total of five patents to his name, Zhang has established himself as a key figure in technological innovation.

Latest Patents

Zhang's latest patents include a built-in self-test (BIST) circuit and a method for operating this circuit. The BIST circuit is designed to generate a test pattern based on multiple test parameters, including a first and second test parameter. This innovative circuit performs tests on at least one memory core. The method involves setting a sweep range that includes a sweep start point and a sweep end point of the first test parameter. It generates a first test pattern for each sweep point and provides this pattern to the memory core. The output data from the memory core is then compared to predetermined reference data, leading to the generation of first test result information based on the comparison results.

Career Highlights

Zhang is currently employed at Samsung Electronics Co., Ltd., where he continues to push the boundaries of technology. His work focuses on enhancing the reliability and efficiency of memory devices through innovative testing methods.

Collaborations

Zhang has collaborated with notable colleagues, including Seung-ho Ok and Sang-Hoon Shin, contributing to advancements in their shared field of expertise.

Conclusion

Pyung-moon Zhang's contributions to the field of built-in self-test circuits and memory devices highlight his innovative spirit and dedication to technological advancement. His work continues to influence the industry and pave the way for future innovations.

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