Pu Zhang

Title: Pu Zhang - Innovator in High Contrast Resolution Assessment

Introduction

Pu Zhang is a notable inventor based in Beijing, China. He has made significant contributions to the field of imaging technology, particularly in the assessment of high contrast resolution in images. His innovative approach combines established criteria with practical applications, enhancing the efficiency of imaging equipment.

Latest Patents

Pu Zhang holds a patent titled "Objective method for assessing high contrast resolution of image based on Rayleigh criterion and testing operating method." This invention presents a novel objective method for evaluating high contrast resolution in images, utilizing the Rayleigh criterion. The method integrates regional pixel intensity profiles, allowing for a simultaneous assessment of high contrast resolution images produced by CT equipment. By introducing a normalized margin and employing a Lanczos window function for interpolation, this method offers a practical and time-effective solution for testers and operators alike. It is designed to track subtle changes in high contrast resolution throughout the lifecycle of CT equipment, thereby improving its operational efficiency.

Career Highlights

Pu Zhang is affiliated with the National Institute of Metrology, China, where he contributes to advancements in measurement and imaging technologies. His work is characterized by a commitment to enhancing the accuracy and reliability of imaging assessments.

Collaborations

Pu Zhang collaborates with Wenli Liu, working together to further their research and innovations in the field of imaging technology.

Conclusion

Pu Zhang's contributions to the assessment of high contrast resolution in imaging technology exemplify his innovative spirit and dedication to improving medical imaging practices. His patent reflects a significant advancement that is poised for widespread application in the industry.