Company Filing History:
Years Active: 1980-1985
Title: Prabhakar Goel: Innovator in Electrical Testing Methods
Introduction
Prabhakar Goel is a notable inventor based in Poughkeepsie, NY (US). He has made significant contributions to the field of electrical testing, holding a total of 4 patents. His work primarily focuses on improving testing methods for packaging structures in electronic devices.
Latest Patents
One of Prabhakar Goel's latest patents is a method of electrically testing a packaging structure. This innovative approach utilizes design rules and test structures to eliminate the need for mechanical probing during testing. The method allows for a test mechanism to be integrated into every chip, enabling the driving of test data on all chip outputs and observing test data on all chip inputs. This functionality operates independently of the logic function performed by the chip. The design rules aim to ensure that each chip can be isolated for testing through the pins of a higher-level package. Additionally, the method adheres to the Level Sensitive Scan Design (LSSD) discipline, ensuring the capability of scanning data into and out of the package's shift register latches.
Career Highlights
Prabhakar Goel is currently employed at International Business Machines Corporation, commonly known as IBM. His work at IBM has allowed him to develop and refine his innovative testing methods, contributing to advancements in the field of electronics.
Collaborations
Throughout his career, Prabhakar has collaborated with notable colleagues, including Maurice T McMahon and Sumit Dasgupta. These collaborations have further enhanced his work and contributed to the development of his patents.
Conclusion
Prabhakar Goel's contributions to electrical testing methods have significantly impacted the electronics industry. His innovative approaches continue to pave the way for advancements in testing technologies.