The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 1980
Filed:
Nov. 20, 1978
Prabhakar Goel, Poughkeepsie, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A path oriented decision making test pattern generator is embodied in a logic chip test system for testing large-scale integrated circuits having many internal nodes inaccessible to the test probes of chip testing machines. For each designated possible chip fault, consisting of a stuck-high or stuck-low voltage at a node of the chip logic network, the generator provides a test pattern of signals to be applied to the input pins of each chip, so that the resulting signal at an output pin indicates whether the fault is present in the chip.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile