Company Filing History:
Years Active: 2009-2011
Title: Prabha Jairam: Innovator in Integrated Circuit Testing
Introduction
Prabha Jairam is a notable inventor based in Fremont, California. She has made significant contributions to the field of integrated circuit testing, holding a total of 4 patents. Her work focuses on enhancing the reliability and efficiency of integrated circuits through innovative testing methods.
Latest Patents
Prabha's latest patents include an "On-chip stuck-at fault detector and detection method." This invention features a test circuit designed for critical path testing in integrated circuits. It incorporates a sequence circuit with two sequential circuits to sensitize the critical path between source and destination circuits. An analyzer circuit captures outputs and compares signals at predetermined clock cycles, ensuring accurate fault detection.
Another significant patent is the "Integrated circuit internal test circuit and method of testing by using test pattern and signature generations therewith." This invention describes a test circuit that utilizes a test pattern generator and a comparison circuit to provide a signature output. The design aims to improve the testing process of integrated circuits, ensuring higher reliability and performance.
Career Highlights
Prabha Jairam is currently employed at Xilinx, Inc., where she continues to innovate in the field of integrated circuits. Her expertise and dedication have made her a valuable asset to her team and the company.
Collaborations
Prabha collaborates with her coworker, Himanshu J Verma, to further advance their projects and share insights in their field of expertise.
Conclusion
Prabha Jairam's contributions to integrated circuit testing through her patents demonstrate her commitment to innovation and excellence. Her work not only enhances the functionality of integrated circuits but also sets a standard for future developments in the industry.