PO-Zen Chen

Title: PO-Zen Chen: Semiconductor and Image Sensor Innovations

Introduction

PO-Zen Chen is an inventor associated with Tainan, Taiwan. His patent work addresses semiconductor inspection and image sensor device fabrication. He is credited with 2 patents and has worked with Taiwan Semiconductor Manufacturing Company.

Latest Patents

Chen’s listed patents cover two areas of semiconductor technology.

“Semiconductor Inspection Tool and Methods of Operation” describes a system designed to monitor the distance between a microscope and a semiconductor workpiece. A support member connects the microscope to a monitoring device, which an actuator spins around the microscope. The device captures images or video to help verify that a minimum safe distance from the workpiece is maintained.

“Method for Forming Image Sensor Devices” describes a process for creating a conductive pad that connects to a metallization layer. The method forms and patterns a recess through buffer oxide and dielectric layers, exposes part of the metallization, and fills the recess with conductive material.

Career Highlights

Chen’s listed professional affiliations include Taiwan Semiconductor Manufacturing Company, Ltd. His patent subjects reflect work related to semiconductor inspection systems and image sensor manufacturing processes.

Collaborations

Huai-Jen Tung is identified as Chen’s coworker. The provided information does not specify their particular projects or patent contributions together.

Conclusion

PO-Zen Chen’s patent portfolio focuses on practical advances in semiconductor inspection and image sensor fabrication, reflecting two complementary aspects of semiconductor technology.