Company Filing History:
Years Active: 2001-2011
Title: **Inventor Profile: Piotr S. Zalicki**
Introduction
Piotr S. Zalicki is a notable inventor based in Sunnyvale, California. With a robust portfolio comprising six patents, Zalicki's contributions primarily focus on advanced techniques in overlay error detection. His expertise and innovative solutions cater primarily to the semiconductor industry, bridging gaps in precision and efficiency.
Latest Patents
Among his latest patents, Zalicki has developed groundbreaking methods for detecting overlay errors using scatterometry. This technology involves a careful arrangement of targets designed to measure offsets between two structures. By employing electromagnetic radiation to illuminate these targets, Zalicki's techniques extract detailed spectra, allowing for the analysis of overlay errors through a series of differential intensity determinations. His inventive approach significantly enhances the accuracy of overlay error assessments, fostering advancements in semiconductor manufacturing processes.
Career Highlights
Zalicki has made significant contributions to several renowned companies in the tech industry. He has notably worked with KLA-Tencor Technologies Corporation, a leader in process control and yield management systems. His experience at Sc Technology, Inc. also underscores his involvement in cutting-edge technological developments. Throughout his career, Zalicki has exemplified a commitment to innovation within the high-tech sector, driving forward the capabilities of overlay detection methodologies.
Collaborations
Throughout his career, Piotr S. Zalicki has collaborated with esteemed professionals, including Walter Dean Mieher and Ady Levy. These partnerships have been instrumental in refining his inventions and pushing the boundaries of technology in overlay error detection and related fields.
Conclusion
Piotr S. Zalicki's work exemplifies the spirit of innovation within the semiconductor industry. His latest patents not only contribute to technical advancements but also showcase his dedication to overcoming challenges in precision measurement. As technology continues to evolve, Zalicki's contributions remain pivotal in shaping future developments in semiconductor manufacturing.