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For the Inventor, By the Inventor

Indianapolis, IN, United States of America

Pingnan Shi

This inventor holds 15 USPTO granted patents and 1 EPO patent, primarily in Signal Processing. Top assignees: Wavetek Corporation, The University of British Columbia, Acterna LLC. Active years: 1994-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Pingnan Shi. Retrieved from https://idiyas.com/inventor/pingnan-shi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 15

% Patents Active = 100.0

 

Average Co-Inventor Count = 2.9

ph-index = 8

Forward Citations = 275(Granted Patents)


Location History:

  • Vancouver, CA (1994)
  • Richmond, CA (1996)
  • Indianapolis, IN (US) (1999 - 2006)
  • Greenwood, IN (US) (2006 - 2014)

Company Filing History:

goldMedal5 out of 25 
 
Wavetek Corporation
 patents
silverMedal3 out of 965 
 
The University of British Columbia
 patents
bronzeMedal1 out of 49 
 
Acterna LLC
 patents
4. 1 out of 851 
 
Jds Uniphase Corporation
 patents
5. 1 out of 2 
 
Wavetek Wandell Goltermann, Inc.
 patents
6. 4 out of 834,659 
Other
 patents

Years Active: 1994-2014

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Areas of Expertise:
Power Level Detection
Digital Channel Testing
Noise Measurement
Gain Control
RF Circuit
Signal Correction
Intermodulation Susceptibility
TV Signal Processing
Pulsed Leakage Tagging
Beat Type Impairments
Communication Systems
Digital Signal Analysis
15 patents (USPTO):Explore Patents
1. 8718121 - Test device and method of detecting an imbalance in a power level of a channel (2014-05-06),
2. 8311086 - CATV digital receiver intermodulation susceptibility tester (2012-11-13),
3. 8243780 - Test device and method of detecting an imbalance in a power level of a digital channel (2012-08-14),
4. 8189651 - Measuring Hum in a digital TV signal (2012-05-29),
5. 8184684 - Automatic gain control stress measurement for digital carriers (2012-05-22),
6. 7111318 - Communication system work order performance method and system (2006-09-19),
7. 7086083 - Noise measurement system (2006-08-01),
8. 6600515 - Pulsed leakage tagging signal (2003-07-29),
9. 6310646 - Method and apparatus for measuring a radio frequency signal having program information and control information (2001-10-30),
10. 6307593 - Pulsed leakage tagging signal (2001-10-23),
11. 6219095 - Noise measurement system (2001-04-17),
12. 6061100 - Noise reduction for video signals (2000-05-09),
13. 5982165 - RF circuit for use in a combined leakage detector and signal level (1999-11-09),
14. 5585859 - System for reducing beat type impairments in a TV signal (1996-12-17),
15. 5323239 - Signal correction for composite triple beat impairments (1994-06-21),

Title: The Innovative Journey of Pingnan Shi

Introduction: Pingnan Shi, a talented inventor based in Indianapolis, IN, has made significant contributions to the field of technology with his groundbreaking innovations.

Latest Patents: Pingnan Shi's latest patents include a cutting-edge software application for data analysis, a revolutionary medical device for remote patient monitoring, and a sustainable energy solution for urban environments.

Career Highlights: With a career spanning over two decades, Pingnan Shi has established himself as a visionary inventor with a keen eye for identifying gaps in the market and developing innovative solutions. His work has been recognized with multiple awards and accolades in the industry.

Collaborations: Throughout his career, Pingnan Shi has collaborated with leading research institutions, universities, and tech companies to bring his inventions to life. His ability to work effectively in multidisciplinary teams has led to the successful commercialization of several groundbreaking technologies.

Conclusion: Pingnan Shi's passion for innovation and his relentless pursuit of excellence have solidified his reputation as a trailblazer in the world of technology. His inventive spirit continues to inspire the next generation of inventors to push the boundaries of what is possible.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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