The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2012

Filed:

Sep. 30, 2008
Applicants:

Walter Miller, Greenwood, IN (US);

Pingnan Shi, Greenwood, IN (US);

Reena Ramname, Fishers, IN (US);

Gregory W. Massey, Greenfield, IN (US);

Inventors:

Walter Miller, Greenwood, IN (US);

Pingnan Shi, Greenwood, IN (US);

Reena Ramname, Fishers, IN (US);

Gregory W. Massey, Greenfield, IN (US);

Assignee:

Acterna LLC, Germantown, MD (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 3/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus are provided for testing susceptibility of a receiver to intermodulation distortion of a digital channel, the method including selecting a first digital channel from channels in a composite signal, determining a first power measurement from the first digital channel, determining a total power measurement from other channels in the composite signal, and determining susceptibility of the first digital channel to intermodulation distortion by comparing the first power measurement and the total power measurement with intermodulation distortion characteristics of the receiver.


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