The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2001

Filed:

Nov. 26, 1997
Applicant:
Inventors:

Pingnan Shi, Indianapolis, IN (US);

Andrew E. Bowyer, Indianapolis, IN (US);

Qin Zhang, Bensalem, PA (US);

Assignee:

Wavetek Corporation, Indianapolis, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/702 ; H04N 5/455 ; G01R 2/502 ; H04B 1/700 ;
U.S. Cl.
CPC ...
H04N 1/702 ; H04N 5/455 ; G01R 2/502 ; H04B 1/700 ;
Abstract

Disclosed are method and apparatus which measure signal level of an RF signal. The measured RF signal includes a baseband signal modulated onto a first carrier signal having a first frequency and the baseband signal includes program information and control information. The method and apparatus digitize the RF signal which includes the baseband control information and determine a signal level measurement from the baseband control information in the digitized RF signal. Furthermore, method and apparatus are disclosed which determine from the digitized RF signal whether a tagging signal is present in the RF signal.


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