This inventor holds 4 USPTO granted patents. Top assignees: Institut National D'optique, Gentec. Active years: 1994-2002.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Ste-Catherine-de-la-Jacques-Cartier, CA (1994 - 1999)
- Sainte-Catherine de la Jacques-Cartier, CA (2002)
Company Filing History:
Years Active: 1994-2002
Title: Innovations of Pierre Langlois
Introduction
Pierre Langlois is a notable inventor based in Ste-Catherine, Canada. He has made significant contributions to the field of optics, holding a total of 4 patents. His work focuses on advanced methods and devices for manipulating light and recording interference patterns.
Latest Patents
One of his latest patents is a device and method for recording an interference pattern in a photosensitive medium. This invention utilizes a single illuminating beam, two diffraction gratings, light detectors, and a slit-scanning system. The device illuminates two slits that define two beams incident on the gratings. The resulting interference on a recording plane produces sinusoidal variations of intensity. Additionally, the method allows for real-time monitoring of light intensity through two detectors. Another significant patent is a method for spatially controlling the period and amplitude of Bragg filters in an optical medium. This method is simpler and more flexible than existing techniques, making it suitable for mass production.
Career Highlights
Throughout his career, Pierre Langlois has worked with esteemed organizations such as the National Institute of Optics and Gentec. His innovative approaches have contributed to advancements in optical technologies.
Collaborations
He has collaborated with notable individuals in the field, including Pierre Galarneau and Yves Painchaud.
Conclusion
Pierre Langlois continues to be a prominent figure in the field of optics, with his inventions paving the way for future advancements. His contributions are invaluable to the scientific community and the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
