The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2002
Filed:
Apr. 13, 2000
Francois Trepanier, Saint-Augustin-de-Desmaures, CA;
Pierre Langlois, Sainte-Catherine de la Jacques-Cartier, CA;
Institut National d'Optique, Quebec, CA;
Abstract
A device and method for recording holographic gratings by the use of a single illuminating beam, two diffraction gratings, light detectors and a slit-scanning system. The beam illuminates two slits that then define two beams that are incident on the gratings. One diffracted order from one beam and one diffracted order from the other beam then interfere on a recording plane to produce sinusoidal variations of intensity. The interfering region may instantaneously be limited by a third slit. Also, another order of diffraction from one beam may be directed toward its own light detector and so is another order of diffraction from the other beam. These two detectors allow real time monitoring of the light intensity of each beam. By moving the slits in a direction parallel to the recording plane, an area larger than the slits' width can be exposed by the interfering pattern.