Nijmegen, Netherlands

Petrus Gerardus Van Rhee


Average Co-Inventor Count = 10.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2021-2025

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3 patents (USPTO):

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**Title: Unveiling the Inventive Mind of Petrus Gerardus Van Rhee**

Introduction:

Petrus Gerardus Van Rhee, a brilliant inventor hailing from Nijmegen, Netherlands, has left a mark in the field of computational metrology with his innovative patents and groundbreaking methodologies.

Latest Patents:

Van Rhee's latest patents showcase his expertise in computational metrology. He introduced a method involving the determination of distributions of parameters associated with errors or residuals in device manufacturing processes. This method utilizes correlations effectively to determine parameters of interest with precision.

Career Highlights:

Petrus Gerardus Van Rhee's remarkable career includes the development of two patents in the field of computational metrology. His contributions to Asml Netherlands B.V., a prominent technology company, have been instrumental in advancing the realm of device manufacturing processes.

Collaborations:

Throughout his journey, Van Rhee has collaborated with esteemed professionals in the industry. Among his coworkers are Wim Tjibbo Tel and Bart Peter Bert Segers, individuals who have shared in his vision and passion for innovation.

Conclusion:

In conclusion, Petrus Gerardus Van Rhee stands as a testament to the power of ingenuity and dedication in the realm of computational metrology. His patents and collaborations exemplify his commitment to pushing boundaries and redefining what is possible in the world of technology.

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