Peter W Neff

Title: The Innovations of Peter W Neff

Introduction

Peter W Neff is a notable inventor based in Cambridge, Vermont, with a remarkable portfolio of nine patents. His work primarily focuses on advancements in integrated circuit (IC) testing technologies, showcasing his expertise in the field of electrical engineering.

Latest Patents

One of Neff's latest inventions is the "Clustered Rigid Wafer Test Probe." This innovative IC device test probe features multiple clusters of tapered probe tips that are designed to seat against various contacts of an IC device. The unique design allows for the application of test signals to multiple contacts either serially or simultaneously, enhancing the efficiency of electrical characterization for small pitch IC devices. Another significant patent is the "Compliant Wafer Probe Assembly," which includes a wafer test device with a conformal laminate and rigid probes. This assembly forms an electrical connection with microcircuits under test, utilizing a spring plate to ensure optimal contact and performance.

Career Highlights

Throughout his career, Peter W Neff has contributed to major companies in the technology sector, including IBM and Globalfoundries Inc. His work in these organizations has allowed him to develop and refine his innovative ideas, leading to significant advancements in IC testing methodologies.

Collaborations

Neff has collaborated with several professionals in his field, including David Michael Audette and David Lewis Gardell. These partnerships have likely contributed to the development and success of his patented technologies.

Conclusion

Peter W Neff's contributions to the field of integrated circuit testing through his innovative patents demonstrate his significant impact on technology. His work continues to influence advancements in electrical engineering and testing methodologies.