The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2018
Filed:
Feb. 03, 2016
Applicant:
Globalfoundries Inc., Grand Cayman, KY;
Inventors:
David L. Gardell, Fairfax, VT (US);
David M. Audette, Colchester, VT (US);
Peter W. Neff, Cambridge, VT (US);
Assignee:
GLOBALFOUNDRIES INC., Grand Cayman, KY;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/073 (2006.01); G01R 33/00 (2006.01); G01R 35/00 (2006.01); G01R 31/24 (2006.01); G01R 31/44 (2006.01); G01R 31/26 (2014.01);
U.S. Cl.
CPC ...
G01R 1/07364 (2013.01); G01R 1/0735 (2013.01); G01R 31/24 (2013.01); G01R 33/0017 (2013.01); G01R 35/005 (2013.01); G01R 31/2635 (2013.01); G01R 31/44 (2013.01);
Abstract
Aspects of the present disclosure provide a gimbal assembly test system including: a protective cover affixed to a test surface of a wafer probe card mounted within a gimbal bearing, wherein the protective cover includes an exterior surface oriented outward from the test surface of the wafer probe card; and a recess extending into the exterior surface of the protective cover and shaped to matingly engage a load cell tip therein.