Princeton, NJ, United States of America

Peter Van Rijn

This inventor holds 1 USPTO granted patent. Top assignee: Educational Testing Service. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Peter Van Rijn. Retrieved from https://idiyas.com/inventor/peter-van-rijn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 9.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Peter Van Rijn

Introduction

Peter Van Rijn is an accomplished inventor based in Princeton, NJ (US). He has made significant contributions to the field of education through his innovative patent. His work focuses on enhancing the assessment of student performance in curriculum-based scenarios.

Latest Patents

Peter Van Rijn holds a patent for a "Platform for characterizing performance on a scenario-based assessment to school differences in curriculum." This method involves accessing data structures associated with products prepared by students. It includes analyzing process data to generate characterization scores and calculating a skill level change metric. This metric indicates the change in a student's ability level over the course of the assessment.

Career Highlights

Peter is currently employed at Educational Testing Service, where he applies his expertise to improve educational assessments. His work is pivotal in developing methods that provide insights into student learning and performance.

Collaborations

Peter has collaborated with notable colleagues, including Paul Douglas Deane and Mo Zhang. Their combined efforts contribute to advancing educational assessment methodologies.

Conclusion

Peter Van Rijn's innovative work in educational assessment exemplifies the impact of inventions on improving student learning outcomes. His contributions are vital in shaping the future of educational evaluations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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