The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2023
Filed:
Jul. 24, 2020
Educational Testing Service, Princeton, NJ (US);
Paul Deane, Lawrenceville, NJ (US);
Mo Zhang, Princeton, NJ (US);
Chen Li, Princeton, NJ (US);
Peter van Rijn, Princeton, NJ (US);
Hongwen Guo, Princeton, NJ (US);
Amanda Roth, Princeton, NJ (US);
Eowyn Winchester, Princeton, NJ (US);
Theresa Richter, Princeton, NJ (US);
Randy Bennett, Princeton, NJ (US);
Educational Testing Service, Princeton, NJ (US);
Abstract
A method comprising accessing a first data structure that is associated with a first product prepared by a student and that includes first process data associated with a process performed by the student in generating the first product, analyzing the first data structure to generate a first characterization score based on the first product and the first process data, accessing a second data structure that is associated with a second product prepared by the student and that includes second process data associated with a process performed by the student in generating the second product, analyzing the second data structure to generate a second characterization score based on the second product and the second process data, and calculating a skill level change metric based on the first characterization score and the second characterization score indicating a change in ability level of the student over a course of the scenario-based assessment.