Educational Testing Service

Peter Van Rijn

Paul Douglas Deane

Mo Zhang

Randy E Bennett

Chen Li

Theresa Richter

Amanda Roth

Hongwen Guo

Eowyn Winchester

A method comprising accessing a first data structure that is associated with a first product prepared by a student and that includes first process data associated with a process performed by the student in generating the first product, analyzing the first data structure to generate a first characterization score based on the first product and the first process data, accessing a second data structure that is associated with a second product prepared by the student and that includes second process data associated with a process performed by the student in generating the second product, analyzing the second data structure to generate a second characterization score based on the second product and the second process data, and calculating a skill level change metric based on the first characterization score and the second characterization score indicating a change in ability level of the student over a course of the scenario-based assessment.

Platform for characterizing performance on a scenario-based assessment to school differences in curriculum

Growing community of inventors

Princeton, NJ, United States of America

Peter Van Rijn