This inventor holds 2 USPTO granted patents and 1 published patent application and 1 EPO patent. Top assignees: Hexagon Metrology Ab, Hexagon Metrology Gmbh. Active years: 2010-2014.
Company Filing History:
Years Active: 2010-2014
Title: The Innovations of Peter Hicks
Introduction
Peter Hicks is an accomplished inventor based in Wyoming, Rhode Island. He holds 2 patents that showcase his expertise in machine calibration and measurement technologies. His work has significantly contributed to advancements in the field of metrology.
Latest Patents
One of Peter Hicks' latest patents is a machine calibration artifact. This calibration artifact features an elongated body made primarily of ceramic material, designed with a direction of elongation. It includes a plurality of measurement elements that are integrally formed with the body, each having a first planar measurement surface that is parallel to the others. This innovative design allows for precise calibration in measurement applications.
Another notable patent is focused on validating the error map of a Coordinate Measuring Machine (CMM) using a calibrated probe. This process involves placing a calibration artifact on the CMM's table and positioning the Z-ram in specific calibration positions. By calculating the measured and nominal values, the error map can be updated if discrepancies are found. This method enhances the accuracy of measurements taken by the CMM.
Career Highlights
Throughout his career, Peter Hicks has worked with prominent companies in the metrology industry, including Hexagon Metrology AB and Hexagon Metrology GmbH. His experience in these organizations has allowed him to refine his skills and contribute to significant advancements in measurement technologies.
Collaborations
Peter has collaborated with notable professionals in his field, including Wilhelmus Weekers and John Langlais. These partnerships have fostered innovation and the sharing of ideas, further enhancing the quality of his work.
Conclusion
Peter Hicks is a distinguished inventor whose contributions to machine calibration and measurement technologies have made a lasting impact. His patents reflect his commitment to precision and innovation in the field of metrology.