The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2014
Filed:
Dec. 14, 2011
Wilhelmus Weekers, East Greenwich, RI (US);
John Langlais, Coventry, RI (US);
David Harvey, West Greenwich, RI (US);
Peter Hicks, Wyoming, RI (US);
Wilhelmus Weekers, East Greenwich, RI (US);
John Langlais, Coventry, RI (US);
David Harvey, West Greenwich, RI (US);
Peter Hicks, Wyoming, RI (US);
Hexagon Metrology, Inc., North Kingstown, RI (US);
Abstract
A calibration artifact includes an elongated body made substantially entirely of ceramic material and having a direction of elongation. A plurality of measurement elements comprising the ceramic material are integrally formed with the elongated body, each measurement element comprising a first planar measurement surface facing in a first direction. The first planar measurement surface of each measurement element is parallel to the first planar measurement surface of each of the other measurement elements of the plurality of measurement elements. The calibration artifact may be a unitary step gauge formed with a single piece of ceramic material.