Nacka Strand, Sweden

Hexagon Metrology Ab


USPTO Granted Patents = 50

% Expired Patents = 20.0


Trademarks = 11

Forward Citations = 1,868

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39 inventors (with patents filed for the assignee):

goldMedal Paul Ferrari (11 out of 41 patents)

silverMedal Bo Pettersson (11 out of 60 patents)

bronzeMedal Dongmei Hong (7 out of 11 patents)

4.  Elie Shammas (6 out of 9 patents)

5.  Pascal Jordil (6 out of 57 patents)

6.  Hogar Tait (6 out of 17 patents)

7.  Jerry Gerent (6 out of 10 patents)

8.  Denny Roux (6 out of 7 patents)

9.  Thibault Duportal (6 out of 18 patents)

10.  Homer L Eaton (4 out of 53 patents)

11.  Laurent Desforges (3 out of 13 patents)

12.  Jean-Paul Delemos (3 out of 4 patents)

13.  Wilhelmus Weekers (3 out of 5 patents)

14.  William Wilcox (3 out of 3 patents)

15.  Jens Hupkau (3 out of 5 patents)


Core Competencies:
CMM
Dimensional Metrology
Articulated Arm
Calibration
Position Detection
Portable Measurement
Vibration Detection
Measurement Probe
Thermal Compensation
Error Compensation
Coordinate Acquisition
Multi-Axis Positioning

50 patents:

Company Overview
Hexagon Metrology AB, based in Nacka Strand, Sweden, specializes in dimensional metrology solutions that enhance precision in manufacturing and quality control processes. The company develops a range of advanced measurement technologies, including coordinate measuring machines (CMM), articulated arms, and portable measurement systems. Their expertise extends to calibration, position detection, and vibration detection, making them a key player in ensuring accuracy and reliability across various industries, including automotive and aerospace.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 13 2026

Hexagon Metrology Ab USPTO Patent Assignee Logo
50 Patents

#2 in Nacka Strand

#139 in Sweden

#14,013 in the World

Nacka Strand, SE
Nacka Strand, Sweden
Forward Citations = 1,868

39 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Hexagon Metrology Ab. Retrieved from https://idiyas.com/company/hexagon-metrology-ab

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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