Jiangsu, China

Peihuang Lou

This inventor holds 3 USPTO granted patents and 1 published patent application. Top assignees: Nanjing University of Aeronautics and Astronautics, Miracle Automation Engineering Corp. Ltd.. Active years: 2019-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Peihuang Lou. Retrieved from https://idiyas.com/inventor/peihuang-lou

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 3 

% Patents Active = 100.0

Average Co-Inventor Count = 4.1

ph-index = 1

Forward Citations = 1(Granted Patents)


Location History:

  • Jiangsu, CN (2019)
  • Nanjing, CN (2023)

Company Filing History:


Years Active: 2019-2025

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3 patents (USPTO):Explore Patents

Title: **Innovations of Peihuang Lou: Pioneering Patents in Image Simulation and Equipment Monitoring**

Introduction

Peihuang Lou is an esteemed inventor based in Jiangsu, China, known for his significant contributions to the fields of image simulation and defect detection. With a portfolio of 3 patents, his work showcases innovative methodologies that address pressing challenges in technology and manufacturing.

Latest Patents

Peihuang Lou’s latest patents include cutting-edge techniques in image simulation, defect dataset generation, and early warning methods for logistics equipment. The first patent presents a method for image simulation generation utilizing near-field computational electromagnetic fields. This process involves creating a three-dimensional model based on specific parameters and utilizing a simulated Kohler illumination model to generate accurate images. By optimizing the balance between the cost of simulation and its accuracy through varying sample sizes, this method significantly enhances the capability to produce realistic images for diverse applications.

His second patent focuses on the generation of pseudo-random defect datasets which enables extensive analysis of patterned wafer defects. This technology facilitates the development of inspection models capable of directly detecting defects, addressing the challenge of limited access to reference images during the detection process.

Additionally, Lou has developed a malfunction early-warning method for production logistics delivery equipment. This innovative approach uses sensor data to extract features and assess operational states through a growing neural gas algorithm. By optimizing regression model parameters and calculating risk coefficients, it allows for timely alerts on equipment malfunctions, thereby improving operational efficiency and reliability.

Career Highlights

Peihuang Lou has had a remarkable career, having worked with prestigious organizations such as the Nanjing University of Aeronautics and Astronautics and Miracle Automation Engineering Corporation. His roles in these institutions have allowed him to apply his expertise in technical research and innovation, propelling advancements in the field of automation and defect detection.

Collaborations

Throughout his career, he has collaborated with notable individuals, including Xiaoming Qian and Dahong Guo. Their combined expertise and efforts have contributed to the development of groundbreaking technologies and have fostered a collaborative environment aimed at furthering innovations in their respective fields.

Conclusion

Peihuang Lou's inventive contributions have made a marked impact on image simulation and equipment monitoring technologies. With his innovative patents and collaborative spirit, he continues to push the boundaries of technology, providing solutions that enhance efficiency and accuracy in complex manufacturing processes. His work stands as a testament to the potential of innovative thinking in transforming industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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