The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2019
Filed:
Dec. 13, 2017
Nanjing Univ. of Aeronautics and Astronautics, Jiangsu, CN;
Miracle Automation Engineering Corp. Ltd., Jiangsu, CN;
Peihuang Lou, Jiangsu, CN;
Dahong Guo, Jiangsu, CN;
Xiaoming Qian, Jiangsu, CN;
Jiong Zhang, Jiangsu, CN;
NANJING UNIV. OF AERONAUTICS AND ASTRONAUTICS, Jiangsu, CN;
MIRACLE AUTOMATION ENGINEERING CORP. LTD., Jiangsu, CN;
Abstract
A two-dimensional three-degree-of-freedom micro-motion platform structure for high-precision positioning and measurement. Two series flexible hinges are connected in parallel to form a moving pair. One end of the moving pair is fixed, and driving force is applied to the other end. The driving force is amplified by means of a lever to drive the moving pair to translate and rotate. The moving pair drives a first flexible hinge of a platform to rotate, thereby driving the platform to produce corresponding displacement. Four identical moving pairs and four identical first flexible hinges respectively constitute four branch hinges which are different in arrangement; two branch hinges opposite to the platform are in central symmetry and constitute one group, and the four branch hinges are divided into two groups in total. The piezoelectric driving mode can be adopted, and thus the linear displacement in the x-axis direction, the linear displacement in the y-axis direction and the angular displacement in the direction around the z-axis are generated for optical precision positioning and measurement.