Taipei, Taiwan

Pei-Zen Chang


Average Co-Inventor Count = 5.1

ph-index = 2

Forward Citations = 43(Granted Patents)


Company Filing History:


Years Active: 2003-2012

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3 patents (USPTO):Explore Patents

Title: Pei-Zen Chang: Innovator in Ultrasonic and Plasmonic Technologies

Introduction

Pei-Zen Chang is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the fields of ultrasonic distance measurement and surface plasmon resonance technologies. With a total of three patents to his name, Chang's work showcases his innovative spirit and technical expertise.

Latest Patents

One of Pei-Zen Chang's latest patents is an ultrasonic distance-measuring sensor with a gap and partition between vibrating surfaces. This invention includes at least two piezoelectric actuators and a member that features a side wall, vibration generating/receiving surfaces, and a partition. The design allows for enhanced measurement capabilities by accommodating the piezoelectric actuators as sources. Another significant patent is a sensor system of surface plasmon resonance (SPR) and its measuring method. This system is designed for analyzing the characteristics of substances and includes an optical device for generating light beams, a sensor device for generating plasmon waves, and a measuring device for analyzing reflective signals.

Career Highlights

Pei-Zen Chang has worked with prestigious institutions such as National Taiwan University and Lenghways Technology Co., Ltd. His experience in these organizations has allowed him to develop and refine his innovative technologies.

Collaborations

Throughout his career, Chang has collaborated with notable colleagues, including Chih-Kung Lee and Jung-Tang Huang. These partnerships have contributed to the advancement of his research and inventions.

Conclusion

Pei-Zen Chang's contributions to ultrasonic and plasmonic technologies highlight his role as a leading inventor in his field. His innovative patents and collaborations reflect his commitment to advancing technology and improving measurement systems.

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