The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2003
Filed:
May. 22, 2002
Chu-Wann Lin, Taipei, TW;
Chi-Yu Huang, Taipei, TW;
Jyh-Perng Chiu, Taipei, TW;
Ying-Tsuen Liou, Taipei, TW;
Shuen-Chen Shiue, Taipei, TW;
Te-Son Kuo, Taipei, TW;
Long-Sun Huang, Taipei, TW;
Pei-Zen Chang, Taipei, TW;
Lung-Jieh Yang, Taipei, TW;
Chau-Chung Wu, Taipei, TW;
Shiming Lin, Taipei, TW;
Chih-Kung Lee, Taipei, TW;
National Taiwan University, Taipei, TW;
Abstract
A sensor system of a surface plasmon resonance (SPR) for analyzing a characteristic of a substance and the measuring method thereof are provided. The system includes an optical device for generating a first light beam and a second light beam in sequence; a sensor device for respectively generating a first plasmon wave and a second plasmon wave in response to an optical characteristic change of the first light beam and the second light beam with respective to the substance, in which a resonance is generated from the first plasmon wave and the second plasmon wave respectively generating a first reflective signal and a second reflective signal; and a measuring device for measuring spectra of the first reflective signal and the second reflective signal and obtaining the measured value which is substituted into an operational formula to calculate a reference value used for analyzing the characteristic of the substance.