Pei-Shiou Huang

Title: Pei-Shiou Huang: Innovator in IC Chip Testing Technology

Introduction

Pei-Shiou Huang is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of integrated circuit (IC) testing technology. His innovative approach has led to the development of a unique testing device that enhances the efficiency of IC chip testing.

Latest Patents

Pei-Shiou Huang holds a patent for a "Pogo pin-free testing device for IC chip test and testing method of IC chip." This invention includes a load board, a ceramic interposer, and copper core balls. The ceramic interposer features first and second surfaces with connecting points, where through holes penetrate both surfaces. The metallization layer on the inner sidewall surface extends to portions of both surfaces, optimizing the testing process. The design allows for effective testing without the need for pogo pins, which can improve reliability and reduce wear.

Career Highlights

Throughout his career, Pei-Shiou Huang has worked with prominent companies in the semiconductor industry. He has been associated with Global Unichip Corporation and Taiwan Semiconductor Manufacturing Company. His experience in these organizations has contributed to his expertise in IC testing technologies.

Collaborations

Pei-Shiou Huang has collaborated with talented individuals in his field, including Chih-Chieh Liao and Yu-Min Sun. These collaborations have fostered innovation and advancements in IC testing methodologies.

Conclusion

Pei-Shiou Huang's contributions to IC chip testing technology exemplify the spirit of innovation in the semiconductor industry. His patented device represents a significant advancement that can enhance testing efficiency and reliability.