This inventor holds 2 USPTO granted patents, plus 1 CIPO patent and 1 EPO patent. Top assignees: Ge Sensing & Inspection Technologies, Gmbh, General Electric Company. Active years: 2015.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Niedersachsen, DE (2015)
- Wunstorf, DE (2015)
Company Filing History:

Years Active: 2015
Title: Inventor Spotlight: Pavel Pokutnev
Introduction
Pavel Pokutnev is a notable inventor based in Niedersachsen, Germany. With a focus on innovations in imaging technology, he has made significant contributions to the field through his patented inventions. His work primarily revolves around the improvement of X-ray inspection systems.
Latest Patents
Pavel holds two patents, which showcase his expertise in the domain of geometric imaging properties and non-destructive object analysis. His first patent is titled "Method for determining geometric imaging properties of a flat panel detector, correspondingly adapted X-ray inspection system and calibration phantom." This patent describes a sophisticated method involving the arrangement of a calibration phantom between an X-ray source and a flat panel detector, allowing for the determination of location-dependent distortion errors in the imaging process.
The second patent, titled "Method system and computer product for non-destructive object analysis," presents an innovative approach to analyzing objects such as parts of turbo machines. By utilizing a three-dimensional image and generating planar surfaces, this method aids in determining the characteristics of the original object in a detailed manner.
Career Highlights
Throughout his career, Pavel has gained valuable experience working with prominent companies in the field, such as GE Sensing & Inspection Technologies GmbH and General Electric Company. His professional journey has allowed him to develop and refine his expertise in advanced imaging systems.
Collaborations
Pavel has collaborated with esteemed colleagues, including Alexander Suppes and Eberhard Neuser. These partnerships have facilitated the exchange of knowledge and ideas, further advancing the innovative projects they have worked on together.
Conclusion
Pavel Pokutnev's contributions to the world of imaging technology through his patents and professional endeavors underline his status as a distinguished inventor. His methodologies continue to enlighten the fields of X-ray inspection and non-destructive analysis, making significant impacts on various industries.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile