The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2015
Filed:
Nov. 18, 2013
GE Sensing & Inspection Technologies Gmbh, Hurth, DE;
Alexander Suppes, Niedersachsen, DE;
Pavel Pokutnev, Niedersachsen, DE;
Eberhard Neuser, Lower Saxony, DE;
Nils Rothe, Sachsen, DE;
GE Sensing & Inspection Technologies GmbH, Hurth, DE;
Abstract
A method and system for determining geometric imaging properties of a flat panel detector in an x-ray inspection system are described herein. The method can include arranging a calibration phantom between an x-ray source and the flat panel detector, the calibration phantom including at least one discrete geometric object. Additionally, the method can include recording at least one x-ray image of the calibration phantom with the flat panel detector. At least one discrete geometric shape is generated in the x-ray image by imaging the at least one discrete geometric object of the calibration phantom. Further, the method can include determining a location-dependent distortion error of the flat panel detector from the at least one x-ray image on the basis of at least one characteristic of the at least one discrete geometric shape. All characteristics of the at least one discrete geometric shape used for determining the location-dependent distortion error are independent of the dimensions of the calibration phantom.