Paul W Rutkowski

Title: Paul W. Rutkowski: Patents in Electronic Testing

Introduction

Paul W. Rutkowski is an inventor based in Morris Plains, New Jersey. His work includes inventions for testing electronic circuits and devices. He holds 4 patents.

Latest Patents

Rutkowski’s listed patents include “Boundary scan cell,” which describes a boundary-scan cell designed to support testing of an electronic device. Its system flip-flop includes asynchronous clear and preset capabilities, allowing it to retain and present a previously latched test bit when needed. During normal operation, those capabilities are disabled so the flip-flop can pass signals between the device’s internal logic and output buffer without undue delay.

His “Pseudo-exhaustive self-test technique” patent describes a method for testing electronic circuits by dividing groups of combinational elements into smaller sub-cones with limited numbers of inputs. Test vectors are assigned so that the inputs receive linearly independent patterns, enabling exhaustive testing of each sub-cone. PEST flip-flop circuits apply the vectors and help compact and observe response data from the sub-cones.

Career Highlights

Rutkowski’s listed professional affiliations include AT&T Bell Laboratories and AT&T Corp. The patent descriptions reflect a focus on electronic-device testing, circuit self-testing, and techniques for managing test signals and responses.

Collaborations

His listed coworkers include John A. Malleo-Roach and Eleanor Wu. Their names are associated with Rutkowski’s professional and patent-related work.

Conclusion

Paul W. Rutkowski’s patents address practical approaches to testing electronic devices and circuits, including boundary-scan functionality and pseudo-exhaustive self-testing.