Paul Bocian

Title: Innovations by Paul Bocian in Electronic Device Testing

Introduction

Paul Bocian is an accomplished inventor based in Saratoga, California, known for his contributions to the field of electronic device testing. With a total of three patents to his name, Bocian has made significant advancements in the technology used for testing thin film transistors and other electronic devices.

Latest Patents

Bocian's latest patents include a configurable prober for TFT LCD array testing. This innovative method involves placing a configurable prober over a substrate, testing the substrate, re-configuring the prober, and then testing additional substrates. The improved prober is designed to adapt to various device layouts and substrate sizes, featuring a frame, prober bars, and electrical contact pins that facilitate communication with a system controller during testing. This technology is particularly useful for testing devices on glass substrates, which are commonly used in the industry.

Career Highlights

Bocian has built a successful career at Applied Materials, Inc., where he has been instrumental in developing testing solutions for electronic devices. His work has contributed to enhancing the efficiency and accuracy of electronic device testing, making significant impacts in the field.

Collaborations

Throughout his career, Bocian has collaborated with notable colleagues, including Matthias Brunner and Shinichi Kurita. These partnerships have fostered innovation and have led to the development of advanced testing technologies.

Conclusion

Paul Bocian's contributions to electronic device testing through his innovative patents and collaborative efforts have established him as a key figure in the industry. His work continues to influence the way electronic devices are tested and evaluated, ensuring advancements in technology.