The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2010
Filed:
Nov. 15, 2007
Matthias Brunner, Kirchcheim, DE;
Shinichi Kurita, San Jose, CA (US);
Ralf Schmid, Poin, DE;
Fayez (Frank) E. Abboud, Pleasanto, CA (US);
Benjamin Johnston, Los Gatos, CA (US);
Paul Bocian, Saratoga, CA (US);
Emanuel Beer, San Jose, CA (US);
Matthias Brunner, Kirchcheim, DE;
Shinichi Kurita, San Jose, CA (US);
Ralf Schmid, Poin, DE;
Fayez (Frank) E. Abboud, Pleasanto, CA (US);
Benjamin Johnston, Los Gatos, CA (US);
Paul Bocian, Saratoga, CA (US);
Emanuel Beer, San Jose, CA (US);
Applied Materials, Inc., Santa Clara, CA (US);
Abstract
A method of testing electronic devices on substrates is described. The method includes placing a configurable prober over a first substrate, testing the first substrate, re-configuring the configurable prober, placing the configurable prober over a second substrate, and testing the second substrate.