Paul Armagnat

Title: Paul Armagnat: Innovator in Digital Circuit Testing

Introduction

Paul Armagnat is a notable inventor based in Seyssinet, France. He has made significant contributions to the field of digital circuit testing, holding a total of 4 patents. His work focuses on enhancing the efficiency and effectiveness of integrated circuit testing methods.

Latest Patents

Among his latest patents is a method for scan-testing of an integrated circuit. This innovative approach involves several steps carried out by the circuit itself, including monitoring bit sequences applied to a use pin and configuring the circuit in a test mode upon identifying a test initialization sequence. Another notable patent is a method for characterizing a bit detection event. This method subdivides each read period into elementary time intervals, allowing for a more efficient counting operation of detected bits, ultimately reducing the test duration for integrated electronic circuits.

Career Highlights

Paul Armagnat has worked with prominent companies in the technology sector, including STMicroelectronics S.A. and STMicroelectronics (Grenoble 2) SAS. His experience in these organizations has contributed to his expertise in digital circuit design and testing.

Collaborations

Throughout his career, Paul has collaborated with talented individuals such as Philippe Lebourg and Thomas Droniou. These partnerships have likely enriched his work and led to innovative solutions in the field.

Conclusion

Paul Armagnat's contributions to digital circuit testing through his patents and collaborations highlight his role as an influential inventor in the technology industry. His innovative methods continue to impact the efficiency of integrated circuit testing.